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1 article(s) from Kotwica, Tomasz

TiAlV structure

Damian Wojcieszak,
Jarosław Domaradzki,
Michał Mazur,
Tomasz Kotwica and
Danuta Kaczmarek

Beilstein J. Nanotechnol. 2022, 13, 265–273, doi:10.3762/bjnano.13.21

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Figure 1: Characteristics of the thermoelectrical voltage of a (Ti–Cu)Ox thin film.

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Figure 2: Direct current-to-voltage characteristics of the Au/(Ti–Cu)Ox/TiAlV thin film structure. Arrows ind...

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Figure 3: Switching characteristics for the Au/(Ti–Cu)Ox/Ti6Al4V thin film structure as a function of the for...

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Figure 4: Retention characteristics for the Au/(Ti–Cu)Ox/TiAlV thin film structure.

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Figure 5: Transmission and reflection characteristics for gradient (Ti–Cu)Ox thin film.

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Figure 6: XPS spectra of the surface of (Ti_0.48Cu_0.52)Ox thin film: a) Cu 2p, b) Ti 2p, and c) O 1s core leve...

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Figure 7: (a) Photoelectron spectrum of the valence band, (b) schematic energy diagram of the surface of the ...

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Figure 8: Results of TEM analysis and distribution of Cu, Ti, O, and Si in the gradient (Ti–Cu)Ox thin film w...

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Figure 9: Schematic illustration of energy level diagrams of the prepared Au/(Ti–Cu)Ox/Ti6Al4V structure. The...

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Published 24 Feb 2022

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